Quantitative analysis of errors in on-wafer S-parameter deembedding techniques for high frequency device modeling

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 2006, Pages

  Groves, Rob ^a   Jing, Wang ^a   Wagner, Lawrence ^a   Wan, Ava ^b  

^a IBM RESEARCH   (United States)

^b Cornell University ^*  (United States)

Author keywords

Calibration; De embedding; High frequency; On wafer; Parameter extraction; s parameter

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE ABSORPTION; OPTIMIZATION; PARAMETER ESTIMATION; PARAMETER EXTRACTION;

DEEMBEDDING TECHNIQUES; HIGH FREQUENCY DEVICE MODELING;

SILICON WAFERS;

EID: 39049161442     PISSN: 10889299     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BIPOL.2006.311119     Document Type: Conference Paper

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7. L. Wagner, unpublished.