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Volumn , Issue , 2006, Pages 651-654

Smart CMOS charge transfer readout circuit for time delay and integration arrays

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; CMOS INTEGRATED CIRCUITS; PROBLEM SOLVING; TIME DELAY;

EID: 39049127905     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2006.320865     Document Type: Conference Paper
Times cited : (19)

References (10)
  • 1
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    • Dose Reduction in Dental Radiotraphy
    • K. Horner, P.N. Hirchmann, "Dose Reduction in Dental Radiotraphy," Journal of Dentistry, Vol.18, No. 4, pp. 171-184, 1990.
    • (1990) Journal of Dentistry , vol.18 , Issue.4 , pp. 171-184
    • Horner, K.1    Hirchmann, P.N.2
  • 5
    • 12344251753 scopus 로고    scopus 로고
    • Digital Mammography
    • E.D. Pisano, M.J. Yaffe, "Digital Mammography," Radiology, Vol. 234, pp. 353-362, 2005.
    • (2005) Radiology , vol.234 , pp. 353-362
    • Pisano, E.D.1    Yaffe, M.J.2
  • 6
    • 0347762694 scopus 로고    scopus 로고
    • Preparation and Characterization of Polycrystalline CdZnTe Films for Large-area, High-sensitivity X-Ray Detectors
    • S. Tokuda, H. Kishihara, S. Adachi, T. Sato, "Preparation and Characterization of Polycrystalline CdZnTe Films for Large-area, High-sensitivity X-Ray Detectors," Journal of Materials Science : Materials in Electronics, Vol. 15, pp. 1-8, 2004.
    • (2004) Journal of Materials Science : Materials in Electronics , vol.15 , pp. 1-8
    • Tokuda, S.1    Kishihara, H.2    Adachi, S.3    Sato, T.4
  • 8
    • 8344235097 scopus 로고    scopus 로고
    • G.G. Sun, H. Samic, J.C. Bourgoin, D. Chambellan, O.Gal, Ph.Pillot, A Comparison Between GaAs and CdTe for X-Ray Detection, IEEE Transactions of Nuclear Science, 51, No. 4, Part 1, pp. 2400-2404, 2004.
    • G.G. Sun, H. Samic, J.C. Bourgoin, D. Chambellan, O.Gal, Ph.Pillot, " A Comparison Between GaAs and CdTe for X-Ray Detection," IEEE Transactions of Nuclear Science, Vol. 51, No. 4, Part 1, pp. 2400-2404, 2004.
  • 9
    • 0036683793 scopus 로고    scopus 로고
    • Smart TDI Readout Circuit for Long-wavelength IR Detector
    • B.H. Kim, H.C. Lee, "Smart TDI Readout Circuit for Long-wavelength IR Detector," Electronics Letters, Vol. 38, No. 16, pp. 854-855, 2002.
    • (2002) Electronics Letters , vol.38 , Issue.16 , pp. 854-855
    • Kim, B.H.1    Lee, H.C.2
  • 10
    • 39049150240 scopus 로고    scopus 로고
    • A Time-Delay-Integration CMOS Readout Circuits for IR Scanning
    • F.K. Tsai, H.Y. Huang, "A Time-Delay-Integration CMOS Readout Circuits for IR Scanning," Proceedings of ICECS, Vol. 1, pp. 347-350, 2002.
    • (2002) Proceedings of ICECS , vol.1 , pp. 347-350
    • Tsai, F.K.1    Huang, H.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.