Smart TDI readout circuit for long-wavelength IR detector

Electronics Letters

Volumn 38, Issue 16, 2002, Pages 854-855

  Kim, Byunghyuk ^a   Lee, Hee Chul ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE; ERROR ANALYSIS; INFRARED DETECTORS;

TIME DELAY AND INTEGRATION (TDI) READOUT CIRCUIT;

DELAY CIRCUITS;

EID: 0036683793     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20020621     Document Type: Article

References (4)

1. Readout electronics for infrared sensors
2. Novel concept of TDI readout circuit for LWIR detector
3. Solid state image sensors steadily advancing
4. Current copier cells