A high-accuracy algorithm for designing arbitrary holographic atom traps

Optics Express

Volumn 16, Issue 3, 2008, Pages 2176-2190

  Pasienski, Matthew ^a   Demarco, Brian ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; HOLOGRAMS; HOLOGRAPHIC GRATINGS; TWO DIMENSIONAL;

ACCURACY; HOLOGRAPHIC ATOM TRAPS; PHYSICAL IMPLEMENTATION;

ELECTRON TRAPS;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; FOURIER ANALYSIS; HOLOGRAPHY; IMAGE ENHANCEMENT; METHODOLOGY; QUANTUM THEORY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING;

ALGORITHMS; FOURIER ANALYSIS; HOLOGRAPHY; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; QUANTUM THEORY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 39049120633     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.002176     Document Type: Article

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