Forensic discrimination of heated and non-heated sheet glasses by analysis of trace impurities using SR-XRF

Bunseki Kagaku

Volumn 56, Issue 12, 2007, Pages 1159-1164

  Kasamatsu, Masaaki ^a   Kikkawa, Hitomi ^a   Higashikawa, Yoshiyasu ^a   Suzuki, Yasuhiro ^a   Suzuki, Shinichi ^a   Nakanishi, Toshio ^b   Takatsu, Masahisa ^b   Shimoda, Osamu ^b   Watanabe, Seiya ^b   Nishiwaki, Yoshinori ^b   Miyamoto, Naoki ^b  

^a NATIONAL RESEARCH INSTITUTE OF POLICE SCIENCE   (Japan)

^b Forensic Science Laboratory   (Japan)

Author keywords

Analysis of trace elements; Forensic science; Sheet glass; Synchrotron radiation X ray fluorescence spectrometry

Indexed keywords

EID: 39049104974     PISSN: 05251931     EISSN: None     Source Type: Journal    
DOI: 10.2116/bunsekikagaku.56.1159     Document Type: Article

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