Forensic discrimination of headlight glass by analysis of trace impurities with synchrotron radiation X-ray fluorescence spectrometry and ICP-MS

Bunseki Kagaku

Volumn 52, Issue 6, 2003, Pages 469-474

  Suzuki, Yasuhiro ^a   Kasamatsu, Masaaki ^a   Sugita, Ritsuko ^a   Ohta, Hikoto ^a,b   Suzuki, Shinich ^a   Marumo, Yoshiteru ^a  

^a NATIONAL RESEARCH INSTITUTE OF POLICE SCIENCE   (Japan)

^b Scientific Investigation Laboratory   (Japan)

Author keywords

Analysis of trace elements; Forensic science; Headlight glass; ICP MS; Synchrotron radiation X ray fluorescence spectrometry

Indexed keywords

ANTIMONY; ARSENIC ACID; BARIUM; CERIUM; GLASS; HAFNIUM; STRONTIUM; TRACE ELEMENT; ZINC; ZIRCONIUM;

ANALYTIC METHOD; ARTICLE; ATOMIC EMISSION SPECTROMETRY; COMPARATIVE STUDY; FORENSIC IDENTIFICATION; MOLECULAR SIZE; SAMPLE; SYNCHROTRON RADIATION; X RAY ANALYSIS; X RAY FLUORESCENCE;

EID: 0038421759     PISSN: 05251931     EISSN: None     Source Type: Journal    
DOI: 10.2116/bunsekikagaku.52.469     Document Type: Article

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