Transient thermal analysis of fast switching devices by partially coupled FEM method

Canadian Conference on Electrical and Computer Engineering

Volumn , Issue , 2006, Pages 1098-1103

  Lakhsasi, Ahmed ^a   Hamri, Youssef ^b  

^a UNIVERSITÉ DU QUÉBEC EN OUTAOUAIS   (Canada)

^b Tecnovacuum   (Italy)

Author keywords

AC motor drives; Electro thermal analysis; Fast heat source changes; Finite element method; IGBT; Power device rating

Indexed keywords

ELECTRIC LOSSES; FINITE ELEMENT METHOD; HEAT LOSSES; INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

AC MOTOR DRIVES; ELECTRO-THERMAL ANALYSIS; FAST HEAT-SOURCE CHANGES; POWER DEVICE RATING;

SWITCHING SYSTEMS;

EID: 39049101635     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCECE.2006.277450     Document Type: Conference Paper

References (6)

1. R. P. Stout and D. T. Billings, "How to extend a thermal RC-network model (derived from experimental data) to respond to an arbitrarily fast input," in Proc. IEEE SEMI-THERM XIV Symposium, San Diego, CA, 1998, pp. 8-15.
2. York C. Gerstenmaier and Gerhard K. M. Wachutka, "Efficient Calculation of Transient Temperature Fields Responding to Fast Changing Heatsources Over Long Duration in Power Electronic Systems" IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, VOL. 27, NO. 1, pp. 104-111, MARCH 2004.
3. A. R. Hefner Jr. "A Dynamic Electro.-Thermal Model for the IGBT" IEEE Transactions on Industry Applications Vol 30 No 2 March/April 1994.
4. H. Rosten, C. J. M. Lasance, and J. Parry, "The world of thermal characterization according to DELPHIPart I: Background to DELPHI," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. 20, pp. 384-398, Dec. 1997.
5. Y. C. Gerstenmaier, H. Pape, and G. Wachutka, "Rigorous model and network for static thermal problems," Microelectron. J., vol. 33, pp. 711-718, 2002.
6. Y. Hamri, A. Lakhsasi and A. Skorek, "Dynamique thermique dans les composants électroniques en commutation", Proceedings of The IEEE/CCECE 2000, Halifax, Nova Scotia , Canada, 7-10 May 2000, pp. 1128-1132.