Comparison of two process capabilities by using indices Cpm: An application to a color STN display

International Journal of Quality and Reliability Management

Volumn 21, Issue 1, 2004, Pages 90-101

  Chen, Jann Pygn ^a   Chen, K S ^a  

^a NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Process analysis; Process control; Process efficiency; Statistics

Indexed keywords

EID: 38949111459     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656710410511713     Document Type: Article

References (14)

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