Investigations of porous InP properties by XRD, IR, USXES, XANES and PL techniques

Materials Science and Engineering: B

Volumn 147, Issue 2-3, 2008, Pages 144-147

  Domashevskaya, E P ^a   Kashkarov, V M ^a   Seredin, P V ^a   Terekhov, V A ^a   Turishchev, S Yu ^a   Arsentyev, I N ^b   Ulin, V P ^b  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

Indium phosphide; Infrared spectroscopy; Surface structure; X ray spectroscopy

Indexed keywords

ELECTROCHEMICAL ETCHING; INFRARED SPECTROSCOPY; PHOTOLUMINESCENCE; POROUS MATERIALS; SURFACE STRUCTURE; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION;

CLUSTER STRUCTURE; POROUS INDIUM PHOSPHIDE; SINGLE-CRYSTALLINE PLATES; ULTRASOFT X-RAY EMISSION SPECTROSCOPY (USXES);

INDIUM PHOSPHIDE;

EID: 38849187976     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.08.029     Document Type: Article

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