Optical characterization of vacuum evaporated a-Se80Te20-xCux thin films

Vacuum

Volumn 82, Issue 6, 2008, Pages 608-612

  Ahmad, Anis ^a   Khan, Shamshad A ^b   Sinha, Kirti ^a   Kumar, Lokendra ^c   Khan, Zishan H ^d   Zulfequar, M ^d   Husain, M ^d  

^a UNIVERSITY OF LUCKNOW   (India)

^b St Andrew's College India   (India)

^c UNIVERSITY OF ALLAHABAD   (India)

^d JAMIA MILLIA ISLAMIA CENTRAL UNIVERSITY   (India)

Author keywords

Amorphous semiconductors; Optical band gap; Optical constants; Thin films

Indexed keywords

AMORPHOUS SEMICONDUCTORS; ENERGY GAP; OPTICAL CONSTANTS; VACUUM EVAPORATION;

EXTINCTION COEFFICIENT; OPTICAL BAND GAP; PHOTON ENERGY;

THIN FILMS;

EID: 38849180065     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2007.09.006     Document Type: Article

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