Improved phase imaging from intensity measurements in multiple planes

Applied Optics

Volumn 46, Issue 33, 2007, Pages 7978-7981

  Soto, Marcos ^a   Acosta, Eva ^a  

^a UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; IRRADIATION; MEASUREMENT THEORY; OPTIMIZATION; PROBLEM SOLVING;

INTENSITY MEASUREMENTS; PHASE IMAGING;

IMAGING TECHNIQUES;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; IMAGE ENHANCEMENT; INTERFEROMETRY; METHODOLOGY; PHASE CONTRAST MICROSCOPY; PHOTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INTERFEROMETRY; MICROSCOPY, PHASE-CONTRAST; PHOTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 38849177459     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.007978     Document Type: Article

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