Validation of x-ray microfocus computed tomography as an imaging tool for porous structures

Review of Scientific Instruments

Volumn 79, Issue 1, 2008, Pages

  Kerckhofs, G ^a,c   Schrooten, J ^a   Van Cleynenbreugel, T ^a,b   Lomov, S V ^a   Wevers, M ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b MATERIALISE NV   (Belgium)

^c NONE   (Belgium)

Author keywords

Porous materials; Threshold; Validation; X ray microfocus computed tomography

Indexed keywords

COMPUTERIZED TOMOGRAPHY; POROUS MATERIALS; X RAY MICROSCOPES;

POROUS STRUCTURES; VALIDATION PROTOCOL; X RAY MICROFOCUS COMPUTED TOMOGRAPHY;

IMAGING SYSTEMS;

TITANIUM;

ARTICLE; CHEMISTRY; COMPUTER ASSISTED TOMOGRAPHY; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; MICROSCOPY; POROSITY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGING, THREE-DIMENSIONAL; MATERIALS TESTING; MICROSCOPY; POROSITY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TITANIUM; TOMOGRAPHY, X-RAY COMPUTED;

EID: 38849173676     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2838584     Document Type: Article

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