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Volumn 80, Issue 3, 2008, Pages 729-733

Use of Raman microscopy and band-target entropy minimization analysis to identify dyes in a commercial stamp. Implications for authentication and counterfeit detection

Author keywords

[No Author keywords available]

Indexed keywords

BAND-TARGET ENTROPY MINIMIZATION (BTEM); DATA BASE MATCHING; RAMAN MICROSCOPY; SPECTRAL PATTERNS;

EID: 38849171806     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac701940k     Document Type: Article
Times cited : (32)

References (36)
  • 14
    • 38849086100 scopus 로고    scopus 로고
    • Widjaja, E.; Garland, M. In Proceeding of the International Conference on Scientific & Engineering Computation (IC-SEC). Recent Advances in Computational Sciences and Engineering, Lee, H. P., Kumar, K., Eds.; Imperial College Press: London, 2002; pp 62-66.
    • Widjaja, E.; Garland, M. In Proceeding of the International Conference on Scientific & Engineering Computation (IC-SEC). Recent Advances in Computational Sciences and Engineering, Lee, H. P., Kumar, K., Eds.; Imperial College Press: London, 2002; pp 62-66.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.