High sensitivity imaging Thomson scattering for low temperature plasma

Review of Scientific Instruments

Volumn 79, Issue 1, 2008, Pages

  Van Der Meiden, H J ^a   Al, R S ^a   Barth, C J ^a   Donn A J H ^a   Engeln, R ^b   Goedheer, W J ^a   De Groot, B ^a   Kleyn, A W ^a,c   Koppers, W R ^a   Lopes Cardozo, N J ^a,b   Van De Pol, M J ^a   Prins, P R ^a   Schram, D C ^a,b   Shumack, A E ^a   Smeets, P H M ^a   Vijvers, W A J ^a   Westerhout, J ^a   Wright, G M ^a   Van Rooij, G J ^a  

^a FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c LEIDEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; ELECTRON TEMPERATURE; IMAGING SYSTEMS; LASER BEAMS; PLASMAS; SPECTROMETERS;

LIGHT SUPPRESSION SYSTEMS; LOW TEMPERATURE PLASMA; PLASMA GENERATORS; THOMSON SCATTERING;

LIGHT SCATTERING;

EID: 38849124832     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2832333     Document Type: Article

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