Calibration procedure and data processing for a TV Thomson scattering system

Review of Scientific Instruments

Volumn 72, Issue 9, 2001, Pages 3514-3527

  Barth, C J ^a   Chu, C C ^a   Beurskens, M N A ^a   Meiden, H J V D ^a  

^a FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035465931     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1386896     Document Type: Article

References (28)

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