Structural properties of poly-Si thin films grown on ZnO:Al coated glass substrates by aluminium induced crystallisation

Journal of Optoelectronics and Advanced Materials

Volumn 9, Issue 2, 2007, Pages 355-358

  Dimova Malinovska, D ^a   Angelov, O ^a   Kamenova, M ^a   Vaseashta, A ^b   Pivin, J C ^c  

^a BULGARIAN ACADEMY OF SCIENCES   (Bulgaria)

^b MARSHALL UNIVERSITY   (United States)

^c CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

Poly Si; Raman spectroscopy; Structural properties; ZnO

Indexed keywords

ALUMINUM; ALUMINUM COATINGS; ALUMINUM METALLOGRAPHY; ANNEALING; FILM PREPARATION; GLASS; II-VI SEMICONDUCTORS; OXIDE MINERALS; POLYSILICON; RAMAN SPECTROSCOPY; SILICON; SILICON COMPOUNDS; SUBSTRATES; THIN FILMS; ZINC OXIDE;

ANNEALING ATMOSPHERES; ANNEALING CONDITION; COATED GLASS SUBSTRATES; CRYSTALLINE PROPERTIES; R.F. MAGNETRON SPUTTERING; RAMAN MICROPROBE SPECTROSCOPY; SOLAR-CELL APPLICATIONS; STRUCTURAL QUALITIES;

STRUCTURAL PROPERTIES;

EID: 38749149607     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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