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Volumn 129, Issue 1, 2007, Pages 9-18

Design optimization and reliability of PWB level electronic package

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; ELECTRIC POWER UTILIZATION; ENERGY DISSIPATION; FATIGUE OF MATERIALS; MICROFABRICATION; OPTICAL INTERCONNECTS; OPTIMIZATION; TEMPERATURE CONTROL;

EID: 38749129094     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2429704     Document Type: Article
Times cited : (24)

References (11)
  • 1
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    • Effect of Simulation Methodology on Solder Joint Crack Growth Correlation and Fatigue Life Prediction
    • Darveaux, R., 2002, "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation and Fatigue Life Prediction," J. Electron. Packag., 124, p. 147.
    • (2002) J. Electron. Packag , vol.124 , pp. 147
    • Darveaux, R.1
  • 2
    • 0036240551 scopus 로고    scopus 로고
    • Optimization Modeling for Flip-chip Solder Joint Reliability
    • Stoyanov, S., Bailey, C., and Cross, M., 2002, "Optimization Modeling for Flip-chip Solder Joint Reliability," Soldering Surf. Mount Technol., 14(1), pp. 746-760.
    • (2002) Soldering Surf. Mount Technol , vol.14 , Issue.1 , pp. 746-760
    • Stoyanov, S.1    Bailey, C.2    Cross, M.3
  • 4
    • 0004075496 scopus 로고    scopus 로고
    • Designing Quality and Reliability into Circuits
    • Lulu, M., 1996, "Designing Quality and Reliability into Circuits," Qual. Eng., pp. 383-393.
    • (1996) Qual. Eng , pp. 383-393
    • Lulu, M.1
  • 5
    • 1442356081 scopus 로고    scopus 로고
    • Analytically Intractable Failure Events
    • Lulu, M., and Magsoodloo, S., 2003, "Analytically Intractable Failure Events," Qual. Eng., 16(2), pp. 283-288.
    • (2003) Qual. Eng , vol.16 , Issue.2 , pp. 283-288
    • Lulu, M.1    Magsoodloo, S.2
  • 6
    • 85199286051 scopus 로고    scopus 로고
    • ANSYS 9.1 Reference Manual
    • ANSYS 9.1 Reference Manual
  • 7
    • 85199286256 scopus 로고    scopus 로고
    • Strain Based Approach for Predicting the Solder Joint Fatigue Life Including Intermetallic Compound
    • Las Vegas, NV
    • Hossain, M. M., Agonafer, D., Puligandla, V., and Reinikainen, T., 2004, "Strain Based Approach for Predicting the Solder Joint Fatigue Life Including Intermetallic Compound," Proceedings ltherm 2004, Las Vegas, NV.
    • (2004) Proceedings ltherm 2004
    • Hossain, M.M.1    Agonafer, D.2    Puligandla, V.3    Reinikainen, T.4
  • 8
    • 0003680898 scopus 로고
    • Reliability of Plastic Ball Grid Array Assembly
    • J. Lau, ed, McGraw-Hill, New York, pp
    • Darveaux, R., Banerji, K., Mawer, A., and Dody, G., 1995, "Reliability of Plastic Ball Grid Array Assembly," Ball Grid Array Technology, J. Lau, ed., McGraw-Hill, New York, pp. 379-442.
    • (1995) Ball Grid Array Technology , pp. 379-442
    • Darveaux, R.1    Banerji, K.2    Mawer, A.3    Dody, G.4
  • 9
    • 85199304903 scopus 로고    scopus 로고
    • Anand, L., Constitutive Equations for the Rate-dependent Deformation of Metals at Elevated Temperatures, Trans. ASME J. Engineering Materials and Technology, 104(1), pp. 12-17.
    • Anand, L., "Constitutive Equations for the Rate-dependent Deformation of Metals at Elevated Temperatures," Trans. ASME J. Engineering Materials and Technology, 104(1), pp. 12-17.
  • 10
    • 85199272809 scopus 로고    scopus 로고
    • Hossain, M. H., Agonafer, D., Puligandla, V., and Reinikainen, T., 2003, The Effect of lntermetallic Compound In Solder Joint Fatigue Life Prediction Using Finite. Element Modeling, Proceedings of The Pacific Rim/ASME International E. Packaging Technical Conference and Exhibition, InterPack' 03, Maui, HI, July 6-11.
    • Hossain, M. H., Agonafer, D., Puligandla, V., and Reinikainen, T., 2003, "The Effect of lntermetallic Compound In Solder Joint Fatigue Life Prediction Using Finite. Element Modeling," Proceedings of The Pacific Rim/ASME International E. Packaging Technical Conference and Exhibition, InterPack' 03, Maui, HI, July 6-11.
  • 11
    • 85199287329 scopus 로고    scopus 로고
    • Zhan, B. A., Impact of Ball via Configuration on Solder Joint Reliability in Tape Based Chip Scale Packages. ChipPack, Inc.
    • Zhan, B. A., "Impact of Ball via Configuration on Solder Joint Reliability in Tape Based Chip Scale Packages." ChipPack, Inc.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.