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Volumn 69, Issue 2-3, 2008, Pages 752-758
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Optical and electrical properties of GaN micron-scale light-emitting diode
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT DENSITY;
ELECTROLUMINESCENCE;
LITHOGRAPHY;
NITRIDES;
OHMIC CONTACTS;
SCHOTTKY BARRIER DIODES;
ETCHING DAMAGE;
LIGHT EXTRACTION;
TUNNELING RECOMBINATION;
LIGHT EMITTING DIODES;
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EID: 38749105081
PISSN: 00223697
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jpcs.2007.07.111 Document Type: Article |
Times cited : (9)
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References (9)
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