Determination of strain gradient plasticity length scale for microelectronics solder alloys

Journal of Electronic Packaging

Volumn 129, Issue 2, 2007, Pages 120-128

  Gomez, Juan ^a   Basaran, Cemal ^b  

^a UNIVERSIDAD EAFIT   (Colombia)

^b UNIVERSITY AT BUFFALO   (United States)

Author keywords

Length scale; Nanoindentation; Size effects; Strain gradient plasticity

Indexed keywords

CONSTITUTIVE MODELS; GRADIENT METHODS; MICROELECTRONICS; PARAMETER ESTIMATION; PLASTICITY; STRAIN;

LENGTH SCALE; STRAIN GRADIENT PLASTICITY;

SOLDERING ALLOYS;

EID: 38749089023     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2721082     Document Type: Article

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