Microstructural characterization of Ce1-xTbxO2-δ (0.60 ≤ x ≤ 0.90) sintered samples

Materials Research Bulletin

Volumn 43, Issue 3, 2008, Pages 759-764

  Ye, Fei ^a   Mori, Toshiyuki ^a   Ou, Ding Rong ^a   Zou, Jin ^b   Drennan, John ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

A. Oxides; C. Electron microscopy; D. Microstructure

Indexed keywords

DOPING (ADDITIVES); LATTICE CONSTANTS; MICROSTRUCTURE; OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CUBIC STRUCTURE; DOPING CONCENTRATION; SINTERED SAMPLES;

CERIUM COMPOUNDS;

EID: 38649142802     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.03.017     Document Type: Article

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