Microstructural characterization of terbium-doped ceria

Materials Research Bulletin

Volumn 42, Issue 5, 2007, Pages 943-949

  Ye, Fei ^a   Mori, Toshiyuki ^a   Ou, Ding Rong ^a   Zou, Jin ^b   Drennan, John ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

A. Oxides; C. Electron energy loss spectroscopy (EELS); C. Electron microscopy; D. Microstructure

Indexed keywords

DIFFRACTION PATTERNS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; MICROSTRUCTURE; PRECIPITATES; TERBIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

FLUORITE-STRUCTURED MATRIX; NANO-SIZED PRECIPITATES;

CERIUM COMPOUNDS;

EID: 33947168230     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2006.08.007     Document Type: Article

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