Digital time alignment of high resolution PET inveon block detectors

IEEE Nuclear Science Symposium Conference Record

Volumn 4, Issue , 2006, Pages 2450-2453

  Lenox, M W ^b   Atkins, B E ^a,b   Pressley, D R ^b   McFarland, A ^a,b   Newport, D F ^a,b   Siegel, S B ^a,b  

^a IEEE

^b SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA FLOW ANALYSIS; OPTIMIZATION; RADIATION DETECTORS; RANDOM PROCESSES;

ELECTRONIC DEADTIME; HARDWARE CAPABILITIES;

POSITRON EMISSION TOMOGRAPHY;

EID: 38649118872     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2006.354407     Document Type: Conference Paper

References (8)

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2. Swann, B.K.; Rochelle, J.M.; Binkley, D.M.; Puckert, B.S.; Blalock, B.J.; Terry, S.C.; Moyers, J.C.; Young, J.W.; Casey, M.E.; Musrock, M.S.; Breeding, J.E. "A custom mixed-signal CMOS integrated circuit for high performance PET tomograph front-end applications,"; IEEE Transactions on Nuclear Science, Volume 50, Issue 4, Aug. 2003 Page(s):909-914.
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