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Volumn 93, Issue 1, 2008, Pages 187-197

Electron backscatter diffraction analysis of zircon: A systematic assessment of match unit characteristics and pattern indexing optimization

Author keywords

EBSD; Match unit; Microstructure; Pressure; Rare earth element; REE; Reflector file; Zircon

Indexed keywords

BACKSCATTERING; CONFORMAL MAPPING; CRYSTALLITES; ELECTRON DIFFRACTION; ELECTRONS; MICROSTRUCTURE; NANOCRYSTALLINE MATERIALS; PRESSURE; RARE EARTH ELEMENTS; RARE EARTHS; SELF ORGANIZING MAPS; SILICATE MINERALS;

EID: 38649110433     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2008.2658     Document Type: Article
Times cited : (22)

References (21)
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  • 13
    • 55349120213 scopus 로고    scopus 로고
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.