Investigation of the aging of epitaxial LaNiO3-x films by X-ray photoelectron spectroscopy

Optica Applicata

Volumn 36, Issue 2-3, 2006, Pages 235-243

  Mickevičius, Sigitas ^a   Grebinskij, Sergej ^a   Bondarenka, Vladimiras ^a   Tvardauskas, Henrikas ^a   Vengalis, Bonifacas ^a   Šliužiene, Kristina ^a   OrŁowski, Bronisław A ^b   Drube, Wolfgang ^c  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^b INSTITUTE OF PHYSICS   (Poland)

^c DESY   (Germany)

Author keywords

LaNiO3; Photoelectron spectroscopy; Reactive D.C. Magnetron sputtering; Synchrotron radiation

Indexed keywords

AGING OF MATERIALS; CONCENTRATION (PROCESS); LANTHANUM COMPOUNDS; STOICHIOMETRY; SURFACE PROPERTIES; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

HYDROXYL GROUPS; REACTIVE D.C. MAGNETRON SPUTTERING; VOLUME COMPOSITION;

EPITAXIAL FILMS;

EID: 38549182309     PISSN: 00785466     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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