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Volumn 9, Issue 8, 2007, Pages 2512-2515

Influence of the substrate temperature on the optical and structural properties of magnetron sputtered ZnO thin films doped with Al and Er

Author keywords

Electrical properties; Optical properties; Structural properties; Thin films; Zno

Indexed keywords

ALUMINUM; BLUE SHIFT; ELECTRIC PROPERTIES; ENERGY GAP; ERBIUM; II-VI SEMICONDUCTORS; MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL FILMS; OPTICAL PROPERTIES; OXIDE MINERALS; STRUCTURAL PROPERTIES; THIN FILMS; ZINC OXIDE;

EID: 38549174263     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (13)

References (15)
  • 7
    • 0003472812 scopus 로고
    • Dover Publications Inc, New York
    • B. E. Warren, X-ray Diffraction, Dover Publications Inc., New York (1990).
    • (1990) X-ray Diffraction
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.