Materials challenges in automotive embedded non-volatile memories

Materials Research Society Symposium Proceedings

Volumn 997, Issue , 2007, Pages 35-49

  Prinz, Erwin Josef ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE ENGINEERING; FLASH MEMORY; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; NANOCRYSTALS; PARAMETER ESTIMATION; PERMITTIVITY; STATIC RANDOM ACCESS STORAGE; TRANSISTORS;

AUTOMOTIVE RELIABILITY; EMBEDDED NON-VOLATILE MEMORIES; FLOATING GATES; HIGH SPEED LOGIC TRANSISTORS; SYSTEM ON A CHIP (SOC);

NONVOLATILE STORAGE;

EID: 38549148324     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0997-i02-01     Document Type: Conference Paper

References (9)

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