Electronic and structural properties of titanium silicide nanostructures formed on Si (111) 7×7 reconstructed surface

Journal of Optoelectronics and Advanced Materials

Volumn 9, Issue 3, 2007, Pages 591-594

  Stiufiuc, R ^a   Soubiron, T ^a   Grandidier, B ^a   Deresmes, D ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

Nanostructure; Self assembling; Surface reconstruction; Titanium suicide

Indexed keywords

ELECTRONIC PROPERTIES; NANOSTRUCTURES; OHMIC CONTACTS; SCANNING TUNNELING MICROSCOPY; SILICIDES; SPECTROSCOPY; SUBSTRATES; SURFACE RECONSTRUCTION; TITANIUM COMPOUNDS; TITANIUM METALLOGRAPHY;

ELECTRONIC AND STRUCTURAL PROPERTIES; ELECTRONIC TRANSPORT PROPERTIES; EXPERIMENTAL SET UP; REACTIVE DEPOSITION; RECONSTRUCTED SURFACES; SCANNING TUNNELING SPECTROSCOPY; SELF-ASSEMBLING; TOPOGRAPHIC IMAGES;

SILICON;

EID: 38549145939     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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