Electrical properties of CuTCNQ based organic memories targeting integration in the CMOS back end-of-line

Materials Research Society Symposium Proceedings

Volumn 997, Issue , 2007, Pages 15-20

  Mueller, Robert ^a   Billen, Joris ^a,b   Naulaerts, Rik ^a,b   Rouault, Olivier ^a,c   Goux, Ludovic ^a   Wouters, Dirk J ^a   Genoe, Jan ^a   Heremans, Paul ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c INSA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC PROPERTIES; GAUSSIAN DISTRIBUTION; METHANE; NONVOLATILE STORAGE; SEMICONDUCTOR MATERIALS; THERMOGRAVIMETRIC ANALYSIS; THRESHOLD VOLTAGE;

NONVOLATILE MEMORIES; ORGANIC MEMORIES; READING CURRENTS; ROOM TEMPERATURE;

CMOS INTEGRATED CIRCUITS;

EID: 38549140077     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0997-i01-10     Document Type: Conference Paper

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