Weibull analysis of switching contact resistance in laboratory and commercial circuit breakers

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 2007, Pages 56-62

  Leung, Chi H ^a   Streicher, Eric ^a   Fitzgerald, Dennis ^a  

^a AMI DODUCO Inc   (United States)

Author keywords

Circuit breaker; Contact resistance; Silver tungsten; Temperature rise; UL489

Indexed keywords

CONTACT RESISTANCE; ELECTRIC CONDUCTIVITY; MELTING POINT; OXIDATION; WEIBULL DISTRIBUTION;

SILVER TUNGSTEN; TEMPERATURE RISE; UL489;

ELECTRIC CIRCUIT BREAKERS;

EID: 38549109459     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HOLM.2007.4318195     Document Type: Conference Paper

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