Failure mechanism of patterned ITO electrodes on flexible substrate under static and dynamic mechanical stresses

Solid State Phenomena

Volumn 124-126, Issue PART 1, 2007, Pages 411-414

  Oh, Jeong Seob ^a   Cho, Young Rae ^a   Cheon, Ko Eun ^a   Karim, Md A ^a   Jung, Seung Jin ^a  

^a Pusan National University   (South Korea)

Author keywords

Failure mechanism; Flexible display; OLED; Patterned ITO electrodes

Indexed keywords

DYNAMIC MECHANICAL ANALYSIS; INDIUM COMPOUNDS; MICROCRACKS; OXIDE FILMS; POLYETHYLENE TEREPHTHALATES; STRESS MEASUREMENT;

FLEXIBLE DISPLAY; PATTERNED ITO ELECTRODES;

ELECTROCHEMICAL ELECTRODES;

EID: 38549099767     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/3-908451-31-0.411     Document Type: Conference Paper

References (7)

1. Ralph Paetzold, Karsten Heuser, Debora Henseler, Stephan Roeger, Georg Wittmann: Appl. Phys. Lett. Vol. 82(19) (2003), p. 3342.
2. Hsin Her Yu, Shung-June Hwang, Kuo-Cheng Hwang: Opt. Communication Vol. 51 (2005), p. 248.
3. Sung-Chul Kim, Jin-Hak Kim, Jeong-Ho Ahn: Polym. Eng. (1994), p. 290.
4. Hong Yee Low, Soo Jin Chua: Mater. Lett. Vol. 53 (2002), p. 227.
5. Zhong Chem, Brian Cotterell, Wei Wang: Eng. Fract. Mech. Vol. 69 (2002), p. 597.
6. Y. Leterrier: Prog. Int. Mater. Sci. Vol. 48 (2003), p. 1.
7. D.R. Cairns, G.P.Crawford: Proc. of the IEEE Vol. 93 (2005), p. 1451.