All-CSS processing of CdS/CdTe thin-film solar cells with thin CdS layers

Materials Research Society Symposium Proceedings

Volumn 1012, Issue , 2007, Pages 157-162

  Davies, Alan R ^a   Sites, J R ^a   Enzenroth, R A ^b   Sampath, W S ^b   Barth, K L ^b  

^a Department of Environmental and Radiological Health Sciences   (United States)

^b Engineering Research Center and Hydraulics Laboratory   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; FABRICATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING CADMIUM TELLURIDE; TEMPERATURE CONTROL; THIN FILMS; CADMIUM TELLURIDE; SOLAR CELLS;

LASER-BEAM-INDUCED CURRENT (LBIC) MAPPING; SCHOTTKY-TYPE JUNCTIONS; VOLTAGE BIAS; CLOSE SPACE SUBLIMATIONS; CURRENT VOLTAGE; HIGH RESOLUTION; LASER-BEAM-INDUCED CURRENTS; NON-UNIFORMITIES; PHOTOCURRENT RESPONSE; SPECTRAL RESPONSE; THIN-FILM SOLAR CELLS;

CADMIUM SULFIDE SOLAR CELLS; CADMIUM SULFIDE;

EID: 38549095545     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1012-y03-23     Document Type: Conference Paper

References (8)

1. th IEEE PVSC Proc., Anchorage, AK, 2000) pp. 491-494.
2. st IEEE PVSC Proc., Orlando, FL, 2005) 347-350.
3. A. Kanevce and J. R. Sites, "Impact of nonuniformities on Voc in thin-film solar cells." Current proceedings.
4. E. Elangovan and K. Ramamurthi, Cryst. Re. Technol. 38, 779-784 (2003).
5. M. N. Islam and M. O. Hakim, Journal of Materials Science Letters 5, 63-65 (1986).
6. W. S. Sampath, K. L. Barth, and R. A. Enzenroth, "Continuous In-line Processing of Stable CdS/CdTe Devices." (NCPV Prog. Review Mtng. Proc., Denver, CO, 2001).
7. C. S. Ferekides, D. Marinskiy, S. Marinskaya, B. Tetali, D. Oman, and D. L. Morel, "CdS Films Prepared by the Close-Spaced Sublimation and their Influence on CdTe/CdS Solar Cell Performance." (25th IEEE PVSC Proc., Washington DC, 1996) pp. 751-756.
8. J. E. Granata, J. R. Sites, G. Contreras-Puente, and A.D. Compaan, "Effect of CdS Thickness on CdS/CdTe Quantum Efficiency." (25th IEEE PVSC Proc., Washington DC, 1996) pp. 853-856.