Influence of window and absorber layer processing on device operation in superstrate thin film CdTe solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 2000-January, Issue , 2000, Pages 491-494

  McCandless, Brian E ^a   Birkmire, Robert W ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; CADMIUM CHLORIDE; CADMIUM SULFIDE; CADMIUM TELLURIDE; FILM THICKNESS; OPTICAL WAVEGUIDES; SOLAR CELLS; ZINC SULFIDE;

CDS/CDTE THIN FILM SOLAR CELLS; CHEMICAL-BATH DEPOSITION; DEVICE OPERATIONS; DEVICE PERFORMANCE; JUNCTION PROPERTIES; OXIDE BUFFER LAYERS; PROCESSING STRATEGIES; THICKNESS TOLERANCE;

THIN FILMS;

EID: 84949567537     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2000.915879     Document Type: Conference Paper

References (9)

1. nd IEEE PVSC, 1991, pp. 967-972.
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3. B. E. McCandless, R. W. Birkmire, NCPV Photovoltaics Program Review, 1999, pp. 182-188.
4. B. E. McCandless, M. G. Engelmann and R. W. Birkmire, Journal of Applied Physics, accepted for publication.
5. th European PVSEC, Glasgow, 2000.
6. S.-H, Wei, S. B. Zhang and A. Zunger, Journal of Applied Physics, 87(3), 2000, pp. 1304-1310.
7. th IEEE PVSC, 1996, pp. 781.
8. th IEEE PVSC, 1997, pp. 307-312.
9. B. E. McCandless, I. Youm, R. W. Birkmire, Progress in Photovoltaics: Research and Applications, 1, 1999, pp. 21-30.