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Volumn 5377, Issue PART 1, 2004, Pages 477-486

Study of air bubble induced light scattering effect on image quality in 193 nm immersion lithography

Author keywords

Immersion; Mie scattering; Optical lithography

Indexed keywords

IMMERSION; IMMERSION LITHOGRAPHY; MIE SCATTERING; NUMERICAL APERTURES (NA);

EID: 3843138266     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.537255     Document Type: Conference Paper
Times cited : (10)

References (5)
  • 1
    • 0141571346 scopus 로고    scopus 로고
    • Water immersion Optical Lithography for the 45 nm node
    • B. W. Smith, H. Kan, et al, "Water immersion Optical Lithography for the 45 nm node", SPIE Optical Microlithography XVI, pp. 679-689, 2003.
    • (2003) SPIE Optical Microlithography , vol.16 , pp. 679-689
    • Smith, B.W.1    Kan, H.2
  • 2
    • 33749662988 scopus 로고    scopus 로고
    • 3 coefficient in nonparaxial λ/NA scaling equations for resolution, depth of focus, and immersion lithography
    • 3 1(1), pp. 7-12, 2002.
    • (2002) 3 , vol.1 , Issue.1 , pp. 7-12
    • Lin, B.J.1
  • 3
    • 0141833635 scopus 로고    scopus 로고
    • Immersion lithography: Its potential performance and issues
    • S. Owa, H. Nagasaka, "Immersion lithography: its potential performance and issues", SPIE Optical Microlithography XVI, pp. 724-732, 2004.
    • (2004) SPIE Optical Microlithography , vol.16 , pp. 724-732
    • Owa, S.1    Nagasaka, H.2
  • 4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.