Ray-tracing analysis of diffractive-refractive X-ray optics

Journal of Synchrotron Radiation

Volumn 11, Issue 2, 2004, Pages 157-162

  Artemiev, Nikolay ^a   Hrdý, Jaromir ^b   Peredkov, Serguei ^c   Artemev, Alexander ^d  

^a LABORATOIRE D OPTIQUE APPLIQUÉE   (France)

^b INSTITUTE OF MATHEMATICS   (Czech Republic)

^c LUND UNIVERSITY   (Sweden)

^d KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

Diffractive refractive X ray lens; Ray tracing; X ray focusing; X ray monochromator

Indexed keywords

COMPUTER SIMULATION; CRYSTALS; DIFFRACTIVE OPTICS; FOCUSING; OPTICAL INSTRUMENT LENSES; OPTICAL SYSTEMS; RAY TRACING; REFRACTIVE INDEX; SYNCHROTRON RADIATION;

DIFFRACTIVE-REFRACTIVE X-RAY LENSES (DRXL); REFRACTION EFFECTS; X-RAY FOCUSING; X-RAY MONOCHROMATORS;

X RAY OPTICS;

ALGORITHM; ARTICLE; COMPARATIVE STUDY; COMPUTER SIMULATION; EVALUATION; METHODOLOGY; OPTICAL INSTRUMENTATION; OPTICS; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SYNCHROTRON; THEORETICAL MODEL; X RAY; X RAY DIFFRACTION;

ALGORITHMS; COMPUTER SIMULATION; LENSES; MODELS, THEORETICAL; OPTICS; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SYNCHROTRONS; X-RAY DIFFRACTION; X-RAYS;

EID: 3843137611     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049503023343     Document Type: Article

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