X-ray focusing using an inclined Bragg-reflection lens

Journal of Synchrotron Radiation

Volumn 6, Issue 5, 1999, Pages 973-978

  Hrdy J ^a,b   Siddons, D P ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Inclined diffraction; Sagittal focusing; X ray lens; X ray monochromator

Indexed keywords

EID: 0033444304     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049599005385     Document Type: Article

References (7)

1. Beaumont, J. & Hart, M. (1974). J. Phys. E. 7, 823-829.
2. Dowd, B. A., Andrews, A. B., Marr, R. B., Siddons, D. P., Jones, K.W. & Peskin, A. M. (1998). In Proceedings of the 47th Annual Denver Conference on X-ray Analysis, Denver, 3-7 August 1998. In the press.
3. Freund, A., Comin, F., Hazemann, J.-L., Hustache, R., Jenninger, B., Lieb, K. & Pierre, M. (1998). Proc. SPIE, 3448, 144-155.
4. Hart, M. & Rodrigues, A. R. D. (1978). J. Appl. Cryst. 11, 248-253.
5. Hrdý, J. (1998). J. Synchrotron Rad. 5, 1206-1210.
6. Hrdý. J., Pascarelli, S., D'Acapito, F., Colonna, S. & Mobilio, S. (1998). J. Synchotron Rad. 5, 54-56.
7. Schulze, C., Heidenreich, G., Auderset, H., Vermeulen, D. & Freund, A. (1998). Proc. SPIE, 3448, 156-165.