ZnSe/ZnSxSe1-x heterojunction valence band discontinuity measured by X-ray photoelectron spectroscopy

Journal of Electronic Materials

Volumn 27, Issue 6, 1998, Pages 776-781

  Sporken, R ^a,b   Abuel Rub, Khaled M ^a,c   Chen, Y P ^a   Sivananthan, S ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b UNIVERSITY OF NAMUR   (Belgium)

^c JORDAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Jordan)

Author keywords

Valance band discontinuity; X ray photoelectron spectroscopy (XPS); ZnSxSe1 x

Indexed keywords

EID: 3843133919     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-998-0053-z     Document Type: Article

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