Morphological, structural and electrical characterization of nanostructured vanadium-tin mixed oxide thin films

Journal of Non-Crystalline Solids

Volumn 341, Issue 1-3, 2004, Pages 68-76

  Manno, D ^a   Serra, A ^a   Micocci, G ^a   Siciliano, T ^a   Filippo, E ^a   Tepore, A ^a  

^a Laboratorio di Fisica Applicata   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CHARGE TRANSFER; DEPOSITION; ELECTRIC CONDUCTIVITY; EVAPORATION; HALL EFFECT; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; SOLAR CELLS; STOICHIOMETRY; TIN; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM COMPOUNDS;

NANOSIZED CRYSTALLINE GRAINS; NANOSTRUCTURED VANADIUM; THERMAL EVAPORATION;

THIN FILMS;

EID: 3843122076     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2004.04.020     Document Type: Article

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