Exchange bias effect in Fe films deposited on Si(100) substrates

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 12, 2007, Pages 4352-4355

  Wang, Wenhong ^a   Takano, Fumiyoshi ^a   Takenaka, Masato ^a   Ofuchi, Hironori ^b   Akinaga, Hiro ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC OXIDES; EXCHANGE BIAS EFFECT; MAGNETIC HYSTERESIS LOOPS; OXIDIZED LAYERS;

CRYSTAL STRUCTURE; ELECTRODEPOSITION; FLUORESCENCE; MAGNETIC HYSTERESIS; SUBSTRATES; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

MAGNETIC FILMS;

EID: 38349163279     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200777415     Document Type: Conference Paper

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