Vision-based online process control in manufacturing applications

IEEE Transactions on Automation Science and Engineering

Volumn 5, Issue 1, 2008, Pages 140-153

  Cheng, Yuan ^b   Jafari, Mohsen A ^a,c  

^a IEEE

^b AMERICAN EXPRESS   (United States)

^c DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

Defect detection; Machine vision; Shape from shading (SFS); Vision based process control

Indexed keywords

COMPUTER VISION; DEFECTS; DYNAMIC MODELS; INSPECTION; LAYERED MANUFACTURING; ONLINE SYSTEMS; PRODUCTION ENGINEERING; THREE DIMENSIONAL;

PROCESS CONTROL MODELS; SHAPE FROM SHADING (SFS); VISION BASED PROCESS CONTROL;

PROCESS CONTROL;

EID: 38149031862     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2007.912058     Document Type: Article

References (32)

1. I. Bakhadyrov, M. A. Jafari, and Y. Cheng, "Snake-based SFS recovery of layered manufacturing surfaces," in Proc. IEEE Int. Conf. Syst., Man, Cybern., Oct. 2006, vol. 1, pp. 272-2771.
2. Bakhadyrov, M. A. Jafari, and Y. Cheng, "Snake-based SFS recovery of layered manufacturing surfaces," IEEE Trans. Pattern Anal. Mach. Intell., vol. 1, pp. 272-277, Oct. 2006.
3. M. Bichsel and A. P. Pentland, "A simple algorithm, for shape from shading," IEEE Proc. Comput. Vision, Pattern Recogn., pp. 459-465, 1992.
4. J. M. Buick and C. A. Greated, "Lattice Boltzmann modeling of interfacial waves," Physics of Fluids, vol. 10, pp. 1490-1511, 1998.
5. D.W. Capson and S.-K. Eng, "A tiered-color illumination approach for machine inspection of solder joints," IEEE Trans. Pattern Anal. Mach. Intell., vol. 10, pp. 387-393, May 1988.
6. F. S. Cohen, Z. Fan, and S. Attali, "Automated inspection of textile fabrics using textural models," IEEE Trans. Pattern Anal. Mach. Intell., vol. 13, pp. 803-808, 1991.
7. A. Crouzil, X. Descombes, and J. D. Durou, "A multiresolution approach for shape from shading coupling deterministic and stochastic optimization," IEEE Trans. Pattern Anal. Mach. Intell., vol. 25, pp. 1416-1421, Nov. 2003.
8. W. Daley and R. A. Carey, "Color machine vision for defect detection (algorithms and techniques)," in Proc. Int. Robot. Vision Autom. Conf., Oct. 1991, pp. 5.29-5.42.
9. S. C. Danforth, M. Agarwala, A. Bandyopadhyay, N. A. Langrana, R. Jamalabad, A. Safari, and R. Van Weeren, "Solid freeform fabrication methods," U.S. Patent No. 5, 1998, pp. 738-817.
10. T. Fang, M. A. Jafari, and I. Bakhadyrov, "On-line defect detection in layered manufacturing using process signature," in Proc. 1998 IEEE Int. Conf. System, Man, Cybern., CA, Oct. 1998, vol. 5, pp. 4373-4378.
11. W. Han and M. A. Jafari, "Coordination control and deposition planning for improving deposition accuracy in layered manufacturing process," in Proc. IEEE Int. Conf. Syst., Man, Cybern., 2000, vol. 3, pp. 1709-1714.
12. G. Hopcraft, "Automated wafer analysis using wafer map autocorrelation," in Proc. 52nd ARFTG Conf. Digest. Computer-Aided Design and Test for High-Speed Electronics, 1998, pp. 82-87.
13. B. K. P. Horn, "Height and gradient from shading," Int. J. Comput. Vision, vol. 5, pp. 37-75, 1990.
14. B. K. P. Horn and M. J. Brooks, Shape from Shading. Cambridge, MA: MIT Press, 1989, pp. 323-347.
15. M. A. Jafari, W. Han, F. Mohammadi, A. Safari, S. C. Danforth, and A. Langrana, "A novel system, for fused deposition of advanced multiple ceramics," Rapid Prototyping, 2000.
16. K. M. Lee and C. C. J. Kuo, "Shape from shading with a linear triangular element surface model," IEEE Trans. Pattern Anal. Mach. Intell., vol. 15, no. 8, pp. 815-822, Aug. 1993.
17. C. H. Meng, H. T. Yau, and G. Y. Lai, "Automated precision measurement of surface profile in CAD-directed inspection," IEEE Trans. Robot. Autom., vol. 8, no. 2, pp. 268-278, Apr. 1992.
18. A. P. Pentland, "Finding the illuminant direction," J.Opt. Soc. Amer., pp. 448-455, 1982.
19. A. P. Pentland, "Local shading analysis," IEEE Trans. Pattern Anal. Mach. Intell., vol. 6, pp. 170-187, 1984.
20. W. H. Press et al, Numerical Recipes in C: The Art of Scientific Computing. Cambridge, U.K.: Cambridge Univ. Press.
21. T. Randen and J. H. Husoy, "Filtering for texture classification: A comparative study," IEEE Trans. Pattern Anal. Mach. Intell., vol. 21, no. 4, pp. 291-310, Apr. 1999.
22. A. Robles-Kelly and E. R. Hancock, "A graph-spectral approach to shape-from-shading," IEEE Trans. Image Process., vol. 13, no. 7, pp. 912-926, Jul. 2004.
23. A. J. Stewart and M. S. Langer, "Toward accurate recovery of shape from shading under diffuse lighting," IEEE Trans. Pattern Analy. Mach. Intell., vol. 19, no. 9, pp. 1020-1025, Sept. 1997.
24. M. Sugeno and K. T. Kang, "Structure identification of fuzzy model," in Fuzzy Modeling and Control. Selected Works of M. Sugeno. New York: CRC Press, 1999.
25. T. Takagi and M. Sugeno, "Fuzzy identification of systems and its applications to modeling and control," in Fuzzy Modeling and Control Selected Works of M. Sugeno. New York: CRC Press, 1999, pp. 129-159.
26. M. Tuceryan and A. K. Jain, Texture Analysis, The Handbook of Pattern Recognition and Computer Vision, C. H. Chen, L. F. Pau, and P. S. P. Wang, Eds. World Scientific: Singapore, 1993, pp. 207-248.
27. R. Zhang, P. S. Tsai, J. E. Cryer, and M. Shah, "Shape from shading: a survey," IEEE Trans. Pattern Anal. Mach. Intell., vol. 21, no. 8, pp. 690-706, Aug. 1999.
28. R. Zhang and M. Shah, "Shape from, intensity gradient," IEEE Trans. Syst., Man, Cybern.-Part A, vol. 29, no. 3, pp. 318-325, May 1999.
29. Q. Zheng and R. Chellappa, "Estimation of illuminant direction, albedo, and shape from shading," IEEE Trans. Pattern Anal Mach. Intell., vol. 13, no. 7, pp. 680-702, 1991.
30. G. Q. Wei and H. Gerd, "Parametric shape-from-shading by radial basis functions," IEEE Trans. Pattern Anal Mach. Intell., vol. 19, no. 4, pp. 353-365, 1997.
31. P. L. Worthington and E. R. Hancock, "New constraints on data-closeness and needle map consistency for shape-from-shading," IEEE Trans. Pattern Anal., 1999.
32. S.-Y. Cho and T. W. S. Chow, "Neural computation approach for developing a 3D shape reconstruction model," IEEE Trans. Neural Netw., vol. 12, no. 5, pp. 1204-1214, Sept. 2001.