On-line defect detection in layered manufacturing using process signature

Proceedings of the IEEE International Conference on Systems, Man and Cybernetics

Volumn 5, Issue , 1998, Pages 4373-4378

  Fang, Tong ^a   Jafari, Mohsen A ^a   Bakhadyrov, Izzat ^a   Safari, Ahmad ^a   Danforth, Stephen ^a   Langrana, Noshir ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; LAYERED MANUFACTURING; ONLINE SYSTEMS;

FUSED DEPOSITION OF CERAMICS (FDC); ON-LINE PROCESS MONITORING SYSTEMS; PROCESS SIGNATURES;

PATTERN RECOGNITION;

EID: 0032309531     PISSN: 08843627     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)