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Volumn 54, Issue 4, 1996, Pages 2723-2727

Topological disorder and conductance fluctuations in thin films

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EID: 0000348904     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.2723     Document Type: Article
Times cited : (17)

References (29)
  • 9
    • 0003186697 scopus 로고
    • B. Fourcade and A.-M. S. Tremblay, Phys. Rev. B 34, 7802 (1986).
    • (1986) Phys. Rev. B , vol.34 , pp. 7802
    • Fourcade, B.1
  • 13
    • 85037897785 scopus 로고
    • L. M. Lust and J. Kakalios, in Amorphous Silicon Technology-1995, edited by M. Hack, E. A. Schiff, A. Madan, M. Powell, and A. Matsuda (Materials Research Society, Pittsburgh, 1995), p. 401.
    • (1995) Amorphous Silicon Technology-1995 , pp. 401
    • Lust, L.1    Kakalios, J.2
  • 26
    • 2842522629 scopus 로고    scopus 로고
    • Materials Research Society, Pittsburgh
    • P. A. Fedders, Amorphous Silicon Technology—1996, edited by M. Hack, E. A. Schiff, S. Wagner, A. Matsuda, and R. Schropp (Materials Research Society, Pittsburgh, 1996).
    • (1996) Amorphous Silicon Technology—1996
    • Fedders, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.