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Volumn , Issue , 2005, Pages 3877-3880

A low voltage low 1/f noise cmos bandgap reference

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; BANDGAP REFERENCE; CMOS BANDGAP REFERENCE; CMOS PROCESS; LOW VOLTAGES; SUPPLY VOLTAGES;

EID: 37849025665     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2005.1465477     Document Type: Conference Paper
Times cited : (25)

References (5)
  • 1
    • 0033717707 scopus 로고    scopus 로고
    • Design of Low-Voltage Bandgap Reference Using Transimpedance Amplifier
    • June
    • Y. Jiang and E. Lee, "Design of Low-Voltage Bandgap Reference Using Transimpedance Amplifier," IEEE Trans. Circuits Syst. II, vol. 47, pp. 552 - 555, June 2000.
    • (2000) IEEE Trans. Circuits Syst. II , vol.47 , pp. 552-555
    • Jiang, Y.1    Lee, E.2
  • 2
    • 0002141789 scopus 로고    scopus 로고
    • Curvature Compensated BiCMOS Bandgap with 1-V Supply voltage
    • P. Malcovati, F. Maloberti, M. Pruzzi, and C. Fiocchi, "Curvature Compensated BiCMOS Bandgap with 1-V Supply voltage," in Proc. ESS-CIRC'2000, pp. 52 - 55.
    • (2000) Proc. ESS-CIRC , pp. 52-55
    • Malcovati, P.1    Maloberti, F.2    Pruzzi, M.3    Fiocchi, C.4
  • 3
    • 0036540694 scopus 로고    scopus 로고
    • A Sub-1-V 15-ppm/oC CMOS Bandgap Voltage Reference without Requiring Low Threshold Voltage Device
    • April
    • K. Leung and P. Mok, "A Sub-1-V 15-ppm/oC CMOS Bandgap Voltage Reference without Requiring Low Threshold Voltage Device," IEEE J. Solid-State Circuits, vol. 37, pp. 526 - 530, April 2002.
    • (2002) IEEE J. Solid-State Circuits , vol.37 , pp. 526-530
    • Leung, K.1    Mok, P.2
  • 5
    • 0036105699 scopus 로고    scopus 로고
    • A Method for Reducing the Effects of Random Mismatches in CMOS Bandgap References
    • Feb
    • V.G. Ceekala et al., "A Method for Reducing the Effects of Random Mismatches in CMOS Bandgap References", ISSCC Digest of Technical Papers, p. 392 - 393, Feb. 2002.
    • (2002) ISSCC Digest of Technical Papers , pp. 392-393
    • Ceekala, V.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.