A method for reducing the effects of random mismatches in CMOS bandgap references

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2002, Pages 392-393+379

  Ceekala, Vijaya G ^a   Lewicki, Lawrence D ^a   Wieser, James B ^a   Varadarajan, Devnath ^a   Mohan, Jitendra ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; DIODES; ELECTRIC POTENTIAL; TRANSISTORS;

BANDGAPS;

CMOS INTEGRATED CIRCUITS;

EID: 0036105699     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. A CMOS bandgap reference circuit with sub - 1 V operation