New type of diffraction elastic constants for stress determination

Materials Science Forum

Volumn 524-525, Issue , 2006, Pages 235-240

  Baczmanski, A ^a   Tidu, A ^b   Lipinski, P ^b   Humbert, M ^b   Wierzbanowski, K ^a  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b UNIVERSITÉ PAUL VERLAINE METZ   (France)

Author keywords

Diffraction elastic constants; Residual stresses; Self consistent model; X ray diffraction

Indexed keywords

ABSORPTION; CRYSTALLITES; ELASTIC CONSTANTS; RESIDUAL STRESSES; X RAY DIFFRACTION;

DIFFRACTION ELASTIC CONSTANTS; SELF-CONSISTENT MODELS; X-RAY MEASUREMENTS;

STRESS MEASUREMENT;

EID: 37849024342     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-414-6.235     Document Type: Conference Paper

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