Microstresses in textured polycrystals studied by the multireflection diffraction method and self-consistent model

Philosophical Magazine

Volumn 83, Issue 28, 2003, Pages 3225-3246

  Baczmanski A ^a   Braham, C ^b   Seiler, W ^b  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELASTIC MODULI; LEAST SQUARES APPROXIMATIONS; PLASTIC DEFORMATION; STEEL; STRAIN RATE; STRESSES; TEXTURES; X RAY DIFFRACTION ANALYSIS;

INCOMPRESSIBILITY STRESSES; LEAST SQUARES FITTING PROCEDURE; MICROSTRESSES; MULTIREFLECTION DIFFRACTION METHOD; SELF-CONSISTENT MODEL;

POLYCRYSTALS;

EID: 0242579392     PISSN: 14786435     EISSN: None     Source Type: Journal    
DOI: 10.1080/14786430310001604985     Document Type: Article

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