In-situ SEM observations of moving interfaces during recrystallisation

Materials Science Forum

Volumn 519-521, Issue PART 2, 2006, Pages 1341-1348

  Van Der Zwaag, S ^a   Anselmino, E ^b   Miroux, A ^b   Prior, D J ^c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b NETHERLANDS INSTITUTE FOR METALS RESEARCH   (Netherlands)

^c UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Aluminium; Dispersoids; EBSD; Grain boundary; In situ; Jerkiness; Recrystallization; SEM

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; GRAIN BOUNDARIES; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY;

DISPERSOIDS; HOT STAGE; IN-SITU OBSERVATIONS; JERKY MOTION;

INTERFACES (MATERIALS);

EID: 37849018798     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.519-521.1341     Document Type: Conference Paper

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