A technique for real-time, in situ SEM observation of grain growth at elevated temperatures

Materials Science Forum

Volumn 467-470, Issue II, 2004, Pages 1385-1388

  Fielden, I M ^a   Rodenburg, J M ^a  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

Author keywords

Grain Growth; Hot Stage Microscopy; In Situ Techniques; Kinetics; Phase Change; Scanning Electron Microscopy (SEM)

Indexed keywords

ALUMINUM; BACKSCATTERING; COPPER; GRAIN GROWTH; HEAT RADIATION; MICROELECTRONICS; SCANNING ELECTRON MICROSCOPY;

HOT STAGE MICROSCOPY; IN SITU TECHNIQUES; KINETICS; PHASE CHANGE;

ELECTRON BEAMS;

EID: 17044427655     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.467-470.1385     Document Type: Conference Paper

References (5)

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4. B.A. Simkin: Ben Simkin's Electron Channeling Contrast Imaging (ECCI) How-To. (online) Available at: http://www.egr.msu.edu/~simkin/ECCI.html modified 2003, accessed 29 January 2004.
5. I.M. Fielden: Results From In-Situ, Real-Time SEM Observations of Grain Growth in Polycrystalline Metals (elsewhere in this conference proceeding).