Inherently safe resonant reset forward converter using a blas-enhanced SiC JFET

Materials Science Forum

Volumn 527-529, Issue PART 2, 2006, Pages 1211-1214

  Kelley, R ^a   Brignac, T ^b   Mazzola, M ^a   Casady, J B ^a  

^a SemiSouth Laboratories Inc   (United States)

^b MISSISSIPPI STATE UNIVERSITY   (United States)

Author keywords

JFET; Normally off power switch

Indexed keywords

ELECTRIC CONVERTERS; ELECTRIC POTENTIAL; PRODUCT DESIGN; SILICON CARBIDE;

FORWARD CONVERTERS; NORMALLY-OFF POWER SWITCH;

JUNCTION GATE FIELD EFFECT TRANSISTORS;

EID: 37848998755     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-425-1.1211     Document Type: Conference Paper

References (4)

1. J. M. Hancock, "Meeting Future Application Challenges in HV Semiconductors," Infineon Technologies, Invited Presentation at IEEE APEC 2004.
2. M. Mazzola and R. Kelley, "Inherently Safe Buck Converter Design for the SemiSouth Silicon Carbide HEL2FET™," Applications Note, March 2005.
3. M. Mazzola, J. B. Casady, N. Merrett, I. Sankin, W. Draper, D. Seale, V. Bondarenko, Y. Koshka, J. Gafford, and R. Kelley, "Assessment of Normally On' and 'Quasi On' SiC VJFET's in Half-Bridge Circuits," Mater. Sci. Forum, Vols. 457-460 (2004), pp. 1153-11 56
4. R. Kelley, M. Mazzola, W. Draper and J. Casady, "Inherently Safe DC-DC Converter Using a Normally-On SiC JFET," IEEE APEC 2005. Volume 3, 6-10 March (2005), pp.1561 - 1565