Field control of the surface electroclinic effect in chiral smectic-A liquid crystals

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 69, Issue 6 1, 2004, Pages

  Maclennan, Joseph E ^a   Muller, David ^a   Shao, Ren Fan ^a   Coleman, David ^a   Dyer, Daniel J ^a,b   Walba, David M ^a   Clark, Noel A ^a  

^a UNIVERSITY OF COLORADO   (United States)

^b SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NYLON ALIGNMENT LAYERS; SURFACE ELECTROCLINIC EFFECT (SEC); TORQUE BALANCE; TOTAL INTERNAL REFLECTION (TIR);

COOLING; ELECTRIC FIELD EFFECTS; INTERFACIAL ENERGY; MATHEMATICAL MODELS; NYLON POLYMERS; PHASE TRANSITIONS; SURFACE TREATMENT; TORQUE;

SMECTIC LIQUID CRYSTALS;

EID: 37649032008     PISSN: 15393755     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.69.061716     Document Type: Article

References (34)

1. K. Nakagawa, T. Shinomiya, M. Koden, K. Tsubota, T. Kuratate, Y. Ishii, F. Funada, M. Matsuura, and K. Awane, Ferroelectrics 85, 39 (1988).
2. J.-Z. Xue and N. A. Clark, Phys. Rev. Lett. 64, 307 (1990).
3. S.-D. Lee, J. S. Patel, and J. W. Goodby, Phys. Rev. A 44, 2749 (1991); S.-D. Lee, J.-H. Kim, J. S. Patel, and J. W. Goodby, Mol. Cryst. Liq. Cryst. Sci. Technol., Sect. A 227, 39 (1993).
4. S.-D. Lee, J. S. Patel, and J. W. Goodby, Phys. Rev. A 44, 2749 (1991); S.-D. Lee, J.-H. Kim, J. S. Patel, and J. W. Goodby, Mol. Cryst. Liq. Cryst. Sci. Technol., Sect. A 227, 39 (1993).
5. W. Chen, Y. Ouchi, T. Moses, Y. R. Shen, and K. H. Yang, Phys. Rev. Lett. 68, 1547 (1992).
6. M. Kimura, M. Yamada, H. Ishihara, and T. Akahane, Mol. Cryst. Liq. Cryst. Sci. Technol., Sect. A 302, 199 (1997).
7. M. S. Spector, S. K. Prasad, B. T. Weslowski, R. D. Kamien, J. V. Selinger, B. R. Ratna, and R. Shashidhar, Phys. Rev. E 61, 3977 (2000).
8. T3, a mixture of three homologous materials notable for showing V shaped switching, is described in A. Fukuda, Y. Takanishi, T. Isozaki, K. Ishikawa, and H. Takezoe, J. Mater. Chem. 4, 997 (1994).
9. S. Seomun, V. P. Panov, and J. K. Vij, Ferroelectrics 278, 151 (2002). This large tilt occurs at rubbed nylon alignment layers.
10. W415 compound 3 in F. Stevens, D. J. Dyer, D. M. Walba, R. Shao, and N. A. Clark, Liq. Cryst. 22, 531 (1997).
11. R.-F. Shao, J. E. Maclennan, N. A. Clark, D. J. Dyer, and D. M. Walba, Liq. Cryst. 28, 117 (2001).
12. S. Garoff and R. B. Meyer, Phys. Rev. Lett. 38, 848 (1977), S. Garoff and R. B. Meyer, Phys. Rev. A 19, 338 (1979).
13. S. Garoff and R. B. Meyer, Phys. Rev. Lett. 38, 848 (1977), S. Garoff and R. B. Meyer, Phys. Rev. A 19, 338 (1979).
14. S. T. Lagerwall, Ferroelectric and Antiferroelectric Liquid Crystals (Wiley, New York, 1999).
15. Nakagawa et al. predicted a field effect but did not successfully demonstrate this experimentally (see Ref. [1]).
16. In virgin T3 cells 2.2 μm thick with polyimide alignment layers, ψ=-13°. A field E= +13 V/μm changes the deviation to ψ≈ +2°, and E= + 26 V/μm to ψ≈ + 5°.
17. J.-Z. Xue, N. A. Clark, and M. R. Meadows, Appl. Phys. Lett. 53, 2397 (1988).
18. Similar optical observations have been made in cells of T3, as reported in S. Ikeda, T. Ogasawara, M. Nakata, Y. Takanishi, K. Ishikawa, and H. Takezoe, Phys. Rev. E 63, 061703 (2001). These authors offered a rather different interpretation, however, suggesting that near the surface of their cell the smectic-C cone angle was decreasing and the layer normal simultaneously twisting towards the rubbing direction.
19. The angular coordinates are consistent with the rather nonintuitive convention introduced by Nakagawa [1] and shown in Fig. 2(b): ψ>0 corresponds to ẑ rotated clockwise from R̂, while θ>0 corresponds to n̂ rotated counterclockwise from ẑ, i.e., ψ and θ have opposite senses of positive rotation.
20. In a fundamentally different effect, the smectic layers in W415 cells can be rotated within the Sm-A* phase by unipolar, pulsed fields, a phenomenon previously observed (in a different material) using asymmetric bipolar pulses [19]. In W415 the rotation can be reversed by changing the sign of E over the range -24° < ψ < +24°. In the Sm-C* phase, the layers can be rotated in either direction, depending on the bias of the applied pulsed field (the range of reorientation is limited to -24° < δψ< +24°). The rotation in the Sm-C* is reversible and occurs more readily than in the Sm-A* phase but is only metastable, the layers returning to their original orientation within 10 h of the applied field being removed. Layer rotation in Sm-C* materials has been studied extensively [20-22]. It has been suggested that the origins of this effect lie in an asymmetric ratcheting of the molecules around the tilt cone [23].
21. K. Nakayama, M. Ozaki, and K. Yoshino, Jpn. J. Appl. Phys., Part 2 35, 6200 (1996).
22. G. Andersson, I. Dahl, L. Komitov, S. T. Lagerwall, M. Matuszczyk, and K. Skarp, presented at the 13th International Liquid Crystal Conference, Vancouver, Canada, 1990; G. Andersson, T. Carlsson, S. T. Lagerwall, M. Matuszczyk, and T. Matuszczyk, presented at the 4th International Conference on Ferroelectric Liquid Crystals, Tokyo, Japan, 1993.
23. G. Andersson, I. Dahl, L. Komitov, S. T. Lagerwall, M. Matuszczyk, and K. Skarp, presented at the 13th International Liquid Crystal Conference, Vancouver, Canada, 1990; G. Andersson, T. Carlsson, S. T. Lagerwall, M. Matuszczyk, and T. Matuszczyk, presented at the 4th International Conference on Ferroelectric Liquid Crystals, Tokyo, Japan, 1993.
24. M. Ozaki, H. Moritake, K. Nakayama, and K. Yoshino, Jpn. J. Appl. Phys., Part 2 33, 1620 (1994); K. Nakayama, H. Moritake, M. Ozaki, and K. Yoshino, ibid. 34, 1599 (1995); K. Nakayama, M. Ozaki, and K. Yoshino, Appl. Phys. Lett. 70, 2117 (1997); S. V. Yablonskii, K. Nakayama, M. Ozaki, and K. Yoshino, JETP Lett. 67, 978 (1998).
25. M. Ozaki, H. Moritake, K. Nakayama, and K. Yoshino, Jpn. J. Appl. Phys., Part 2 33, 1620 (1994); K. Nakayama, H. Moritake, M. Ozaki, and K. Yoshino, ibid. 34, 1599 (1995); K. Nakayama, M. Ozaki, and K. Yoshino, Appl. Phys. Lett. 70, 2117 (1997); S. V. Yablonskii, K. Nakayama, M. Ozaki, and K. Yoshino, JETP Lett. 67, 978 (1998).
26. M. Ozaki, H. Moritake, K. Nakayama, and K. Yoshino, Jpn. J. Appl. Phys., Part 2 33, 1620 (1994); K. Nakayama, H. Moritake, M. Ozaki, and K. Yoshino, ibid. 34, 1599 (1995); K. Nakayama, M. Ozaki, and K. Yoshino, Appl. Phys. Lett. 70, 2117 (1997); S. V. Yablonskii, K. Nakayama, M. Ozaki, and K. Yoshino, JETP Lett. 67, 978 (1998).
27. M. Ozaki, H. Moritake, K. Nakayama, and K. Yoshino, Jpn. J. Appl. Phys., Part 2 33, 1620 (1994); K. Nakayama, H. Moritake, M. Ozaki, and K. Yoshino, ibid. 34, 1599 (1995); K. Nakayama, M. Ozaki, and K. Yoshino, Appl. Phys. Lett. 70, 2117 (1997); S. V. Yablonskii, K. Nakayama, M. Ozaki, and K. Yoshino, JETP Lett. 67, 978 (1998).
28. See I. Dierking and G. Scalia, Liq. Cryst. 27, 1059 (2000), and references therein.
29. T. Carlsson and M. A. Osipov, Phys. Rev. E 60, 5619 (1999).
30. s might show some variation depending on the magnitude of the layer deviation.
31. F. Gießelmann and P. Zugenmaier, Phys. Rev. E 52, 1762 (1995).
32. M. J. O' Callahan and M. A. Handschy, Opt. Lett. 16, 770 (1991).
33. T. D. Wilkinson, W. A. Crossland, and A. B. Davey, Ferroelectrics 278, 227 (2002); W. A. Crossland, T. D. Wilkinson, I. G. Manolis, M. M. Redmond, and A. B. Davey, Mol. Cryst. Liq. Cryst. Sci. Technol., Sect. A 375, 1 (2002).
34. T. D. Wilkinson, W. A. Crossland, and A. B. Davey, Ferroelectrics 278, 227 (2002); W. A. Crossland, T. D. Wilkinson, I. G. Manolis, M. M. Redmond, and A. B. Davey, Mol. Cryst. Liq. Cryst. Sci. Technol., Sect. A 375, 1 (2002).