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Volumn 22, Issue 5, 1997, Pages 531-534
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Dynamics of vacancy defects in 2-d crystalline monolayers under chiral smectic thin films studied by scanning tunnelling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0004738336
PISSN: 02678292
EISSN: 13665855
Source Type: Journal
DOI: 10.1080/026782997208901 Document Type: Article |
Times cited : (8)
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References (11)
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